SEM and EDS analyzes → Обява 47205463

We perform SEM and EMF analyzes with a SEM JEOL-733 microscope with capabilities to visualize the structure, surface morphology and composition of materials.

Objects of analysis can be thin single-layer and multi-layer structures, bulky and fibrous materials, broken surfaces (fractography), biological objects, etc.

With the help of the WDX (Wavelength Dispersive X-ray analyzer) microprobe, qualitative and quantitative analysis (in a point, line or area) of the chemical elements in the examined samples can be carried out.

Samples up to 350 x 350 x 100 mm in size can be analyzed;

Preliminary preparation of objects for analysis - if necessary, cutting, breaking (for fractography), grinding, polishing, developing, covering with a conductive element, observing and obtaining a digital image using a light microscope can be carried out;

Surface topography study (STO) - the secondary electrons from the object are used, which give an image with high resolution and depth of focus, which allows three-dimensional visualization of the observed morphology; maximum magnification 40,000x;

Image of the surface composition of the object (COMPO) - illustrates a picture of the surface according to the distribution of chemical elements with different atomic mass;

Elemental analysis with sensitivity ~ 0.5 wt % and lowest atomic number for detectable element 11 (Na). Through an X-ray photon length analyzer, information can be obtained about chemical elements at a depth of 0.5 µm and their amount in the area of incidence of the electron beam with dimensions from 1 to 50 µm;